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Tag Archives: scanning transmission electron microscope

Small worlds come into focus with new Sandia microscope

ALBUQUERQUE, N.M. — Paul Kotula recently told a colleague that Sandia’s new aberration-corrected scanning transmission electron microscope (AC-STEM) was like a Lamborghini with James Bond features.  The $3.2 million FEI Titan G2 8200 is 50 to 100 times better than what came before, both in resolution and the time it takes to analyze a sample, […]